4D.TWO®

Process Mon­i­tor­ing for Demand­ing Laser Processes

4D.TWO®

Process Mon­i­tor­ing for Demand­ing Laser Processes

About the Product

More Sig­nals. More Insight. More Possibilities.

4D.TWO® cap­tures mul­ti­ple opti­cal sig­nals from a laser process simul­ta­ne­ous­ly, reveal­ing process vari­a­tions that may remain hid­den when rely­ing on indi­vid­ual chan­nels alone.

By com­bin­ing spec­tral­ly resolved data with high-speed inte­grat­ed sig­nals, 4D.TWO® pro­vides a com­pre­hen­sive and ver­sa­tile data foun­da­tion for indus­tri­al process mon­i­tor­ing. This mul­ti-dimen­sion­al view enables deep­er process insight, sup­ports reli­able anom­aly detec­tion, and opens up new pos­si­bil­i­ties for data-dri­ven process optimization.

Chal­lenges

A Laser Process Deliv­ers More Infor­ma­tion Than a Sin­gle Sig­nal Can Reveal

Emis­sions in the vis­i­ble and near-infrared spec­trum, back reflec­tions, and tran­sient sig­nal vari­a­tions can each pro­vide dif­fer­ent insights into a laser process. When only indi­vid­ual sig­nals are mon­i­tored, valu­able process infor­ma­tion may remain undiscovered.

4D.TWO® com­bines mul­ti­ple opti­cal infor­ma­tion sources with­in a sin­gle sys­tem, cre­at­ing a com­pre­hen­sive data foun­da­tion for process mon­i­tor­ing. By cap­tur­ing and cor­re­lat­ing dif­fer­ent process sig­nals simul­ta­ne­ous­ly, it enables a deep­er under­stand­ing of process behav­ior and helps uncov­er changes that might oth­er­wise go unnoticed.

How It Works

One Sen­sor. Mul­ti­ple Per­spec­tives on Your Process.

4D.TWO® simul­ta­ne­ous­ly cap­tures spec­tral infor­ma­tion in the vis­i­ble (VIS) and near-infrared (NIR) wave­length ranges. Depend­ing on the sen­sor vari­ant, dif­fer­ent spec­tral chan­nels are avail­able to pro­vide tai­lored process insights.

In addi­tion, inte­grat­ed chan­nels enable high-speed sig­nal acqui­si­tion with sam­pling rates of up to 100 kHz. By com­bin­ing spec­tral­ly resolved and inte­grat­ed sig­nals, 4D.TWO® deliv­ers a mul­ti-dimen­sion­al view of the laser process, cre­at­ing a rich data foun­da­tion for advanced process mon­i­tor­ing and analysis.

Cap­ture Spec­tral­ly Resolved Data 

Ana­lyze dif­fer­ent wave­length ranges sep­a­rate­ly and gain addi­tion­al insights from process emissions. 

Detect Rapid Changes 

High-speed inte­grat­ed chan­nels com­ple­ment the spec­tral data and cap­ture dynam­ic process vari­a­tions with sam­pling rates of up to 100 kHz. 

Com­bine Data Sources 

Cor­re­late mul­ti­ple sig­nals to cre­ate a com­pre­hen­sive view of the process and lever­age the infor­ma­tion most rel­e­vant to your application. 

Spec­tral­ly Resolved and Inte­grat­ed Sig­nal Acquisition

From VIS to NIR: More Infor­ma­tion from a Sin­gle Process

Detect Brief Events With­out Gen­er­at­ing Exces­sive Data

Loss­less Technology

Fast process devi­a­tions do not nec­es­sar­i­ly require mas­sive amounts of data. The Loss­less Tech­nol­o­gy of 4D.TWO® enables the reli­able detec­tion of extreme­ly short sig­nal vari­a­tions while keep­ing data vol­umes manageable.

Events last­ing less than 40 µs can be detect­ed at a 100% sig­nal change. At a feed rate of 1,000 mm/s, this cor­re­sponds to a dis­tance of just 40 µm. At the same time, the tech­nol­o­gy reduces the raw data vol­ume of 32 opti­cal chan­nels to only 25% of that gen­er­at­ed by a con­ven­tion­al set­up with three chan­nels sam­pled at 250 kHz each.

Ver­sa­tile Process Monitoring

One Sen­sor Sys­tem for Dif­fer­ent Laser Processes

Welding 

Cutting 

Structuring 

Addi­tive Man­u­fac­tur­ing / LPBF 

Cleaning 

Heat Treatment 

3D Printing 

Coating 

Laser Bonding 

Brazing 

Drilling 

Can’t find your process? Con­tact us. 

Appli­ca­tions

Process Mon­i­tor­ing Wher­ev­er Laser Process­es Matter

Automotive 

E‑Mobility

Bat­tery Cells

Bipo­lar Plates

Aviation 

Med­ical Products 

Elec­tri­cal Components 

Don’t see your appli­ca­tion? Get in touch with us. 

Mix and Match: Com­bine Hard­ware and Inte­gra­tion to Fit Your Needs

Which 4D.TWO Is Right for Your Application?

Not every appli­ca­tion requires the same num­ber of chan­nels or the same sys­tem con­fig­u­ra­tion. That’s why 4D.TWO® is avail­able in a range of hard­ware and inte­gra­tion variants.

Inte­gra­tion Options

How 4D.TWO Con­nects to Your Process

4D.TWO DirectMount direkt an einer industriellen Laserbearbeitungsoptik montiert

Direct­Mount

The sen­sor is mount­ed direct­ly to the pro­cess­ing optics. A direct opti­cal path between the process and the sen­sor enables effi­cient cap­ture of process emis­sions with min­i­mal opti­cal complexity.

4D.TWO DirectMount mit 90 Grad Umlenker an einer industriellen Laserbearbeitungsoptik

Direct­Mount with 90° Deflec­tion Unit

The sen­sor is mount­ed off­set from the opti­cal axis. A 90° deflec­tion unit redi­rects the opti­cal path to the sen­sor, enabling inte­gra­tion where space con­straints or mechan­i­cal con­di­tions pre­vent direct inline mounting.

4D.TWO Fiber in einer industriellen Laserbearbeitungsanlage zur Erfassung von Prozessemissionen

Fiber

The sen­sor is installed remote­ly from the process. Process emis­sions are cap­tured by an opti­cal assem­bly and trans­mit­ted to the sen­sor via an opti­cal fiber, enabling flex­i­ble inte­gra­tion even when instal­la­tion space near the process is limited.

Your Appli­ca­tion Deter­mines the Configuration.

Hard­ware and inte­gra­tion options can be com­bined to match the require­ments of each appli­ca­tion. This flex­i­bil­i­ty elim­i­nates the need for a com­plete­ly dif­fer­ent sen­sor con­cept for every instal­la­tion sce­nario or mon­i­tor­ing task.

From Sig­nal Acqui­si­tion to Process Monitoring

Cap­ture. Under­stand. Act.

01 | Capture

4D.TWO® cap­tures mul­ti­ple types of opti­cal infor­ma­tion from the laser process.

02 | Analyze

The avail­able sig­nals can be ana­lyzed and eval­u­at­ed for the spe­cif­ic application.

03 | Configure

Rel­e­vant sig­nals and set­tings are select­ed for the respec­tive mon­i­tor­ing task.

04 | Monitor

The result­ing insights form the foun­da­tion of an appli­ca­tion-spe­cif­ic process mon­i­tor­ing solution.

Your Ben­e­fits

Why 4D.TWO?

More Insight from a Sin­gle Sensor 

Mul­ti­ple opti­cal sig­nals are cap­tured simul­ta­ne­ous­ly, pro­vid­ing a rich­er data foun­da­tion for process analysis. 

Adapt­able to Your Application 

Choose the hard­ware, inte­gra­tion method, and soft­ware con­fig­u­ra­tion that best fit your appli­ca­tion requirements. 

Cap­ture Short Process Events 

Loss­less Tech­nol­o­gy enables the detec­tion of extreme­ly short sig­nal vari­a­tions while reduc­ing data volume. 

From Sin­gle Appli­ca­tions to OEM Integration 

Stan­dard vari­ants for con­ven­tion­al appli­ca­tions and OEM ver­sions for advanced cus­tomer-spe­cif­ic integration. 

One Plat­form for Dif­fer­ent Laser Processes 

Use 4D.TWO® across a wide range of laser appli­ca­tions, from weld­ing and cut­ting to addi­tive manufacturing. 

In Detail

Tech­ni­cal Data

4D.TWO
Fea­ture
eco
pro
max
VIS (350–900 nm)
Spec­trom­e­ter 16x @6 kHz loss­less**
Full inte­gral @100 kHz lossless*
NIR (1,100–1,700 nm)
Full inte­gral
@100 kHz lossless*
eco
+
Spectrometer
4x @6 kHz lossless**
eco
+
Spectrometer
16x @6 kHz lossless**
Oth­er Data
Con­di­tion data (tem­per­a­ture, humid­i­ty, pressure)
Motion Track­er
Tilt and accel­er­a­tion in X, Y, Z @100 Hz
Inter­face
1x Con­nec­tor for PoE (IEEE 802.3af) and com-muni­ca­tion, mechan­i­cal­ly keyed to pre­vent mis­match­ing (60°)

1x Con­nec­tor for I/O (Ana­log In, Ana­log Out), mechan­i­cal­ly keyed to pre­vent mis­match­ing (45°)

1x Con­nec­tor for the DIRECTMOUNT Focus Unit / SMA opti­cal fiber
Dimen­sions (W x H x D)
Fiber:
63 x 78 x 91.5 mm

DIRECTMOUNT:
67.3 x 78 x 150.7 mm

DIRECTMOUNT with 90 ° Deflec­tion Unit:
67.3 x 85.8 x 213.5 mm
Inte­gra­tion Options
DIRECTMOUNT and Fiber
*100 kHz loss­less ≙ Mega­hertz Class Defect Information
**6 kHz loss­less ≙ 100 Kilo­hertz Class Defect Information 
4D.TWO
Fea­ture
eco
pro
max
VIS (350–900 nm)
Spec­trom­e­ter 16x @6 kHz loss­less**
Full inte­gral @100 kHz lossless*
NIR (1,100–1,700 nm)
Full inte­gral
@100 kHz lossless*
eco
+
Spectrometer
4x @6 kHz lossless**
eco
+
Spectrometer
16x @6 kHz lossless**
Oth­er Data
Con­di­tion data (tem­per­a­ture, humid­i­ty, pressure)
Motion Track­er
Tilt and accel­er­a­tion in X, Y, Z @100 Hz
Inter­face
1x Con­nec­tor for PoE (IEEE 802.3af) and com-muni­ca­tion, mechan­i­cal­ly keyed to pre­vent mis­match­ing (60°)

1x Con­nec­tor for I/O (Ana­log In, Ana­log Out), mechan­i­cal­ly keyed to pre­vent mis­match­ing (45°)

1x Con­nec­tor for the DIRECTMOUNT Focus Unit / SMA opti­cal fiber
Dimen­sions (W x H x D)
Fiber:
63 x 78 x 91.5 mm

DIRECTMOUNT:
67.3 x 78 x 150.7 mm

DIRECTMOUNT with 90 ° Deflec­tion Unit:
67.3 x 85.8 x 213.5 mm
Inte­gra­tion Options
DIRECTMOUNT and Fiber
*100 kHz loss­less ≙ Mega­hertz Class Defect Information
**6 kHz loss­less ≙ 100 Kilo­hertz Class Defect Information 

Patent

The respec­tive patent with the title Device for the spec­tral­ly resolved detec­tion of opti­cal radi­a­tion (file num­ber DE: 10 2021 111 892.1) can be found here.

Which 4D.TWO is right for your laser process?

The appro­pri­ate con­fig­u­ra­tion depends on your laser process, the rel­e­vant process sig­nals, and the avail­able instal­la­tion space. Togeth­er, we’ll find the right com­bi­na­tion of hard­ware and inte­gra­tion options for your application.

Which 4D.TWO is right for your laser process?

The appro­pri­ate con­fig­u­ra­tion depends on your laser process, the rel­e­vant process sig­nals, and the avail­able instal­la­tion space. Togeth­er, we’ll find the right com­bi­na­tion of hard­ware and inte­gra­tion options for your application.

Scroll to Top