4D.TWO®
Process Monitoring for Demanding Laser Processes
4D.TWO®
Process Monitoring for Demanding Laser Processes

About the Product
More Signals. More Insight. More Possibilities.
4D.TWO® captures multiple optical signals from a laser process simultaneously, revealing process variations that may remain hidden when relying on individual channels alone.
By combining spectrally resolved data with high-speed integrated signals, 4D.TWO® provides a comprehensive and versatile data foundation for industrial process monitoring. This multi-dimensional view enables deeper process insight, supports reliable anomaly detection, and opens up new possibilities for data-driven process optimization.

Challenges
A Laser Process Delivers More Information Than a Single Signal Can Reveal
Emissions in the visible and near-infrared spectrum, back reflections, and transient signal variations can each provide different insights into a laser process. When only individual signals are monitored, valuable process information may remain undiscovered.
4D.TWO® combines multiple optical information sources within a single system, creating a comprehensive data foundation for process monitoring. By capturing and correlating different process signals simultaneously, it enables a deeper understanding of process behavior and helps uncover changes that might otherwise go unnoticed.

How It Works
One Sensor. Multiple Perspectives on Your Process.
4D.TWO® simultaneously captures spectral information in the visible (VIS) and near-infrared (NIR) wavelength ranges. Depending on the sensor variant, different spectral channels are available to provide tailored process insights.
In addition, integrated channels enable high-speed signal acquisition with sampling rates of up to 100 kHz. By combining spectrally resolved and integrated signals, 4D.TWO® delivers a multi-dimensional view of the laser process, creating a rich data foundation for advanced process monitoring and analysis.
Capture Spectrally Resolved Data
Analyze different wavelength ranges separately and gain additional insights from process emissions.
Detect Rapid Changes
High-speed integrated channels complement the spectral data and capture dynamic process variations with sampling rates of up to 100 kHz.
Combine Data Sources
Correlate multiple signals to create a comprehensive view of the process and leverage the information most relevant to your application.

Detect Brief Events Without Generating Excessive Data
Lossless Technology
Fast process deviations do not necessarily require massive amounts of data. The Lossless Technology of 4D.TWO® enables the reliable detection of extremely short signal variations while keeping data volumes manageable.
Events lasting less than 40 µs can be detected at a 100% signal change. At a feed rate of 1,000 mm/s, this corresponds to a distance of just 40 µm. At the same time, the technology reduces the raw data volume of 32 optical channels to only 25% of that generated by a conventional setup with three channels sampled at 250 kHz each.

Versatile Process Monitoring
One Sensor System for Different Laser Processes
Welding
Cutting
Structuring
Additive Manufacturing / LPBF
Cleaning
Heat Treatment
3D Printing
Coating
Laser Bonding
Brazing
Drilling
Can’t find your process? Contact us.

Applications
Process Monitoring Wherever Laser Processes Matter
Automotive
E‑Mobility
Battery Cells
Bipolar Plates
Aviation
Medical Products
Electrical Components
Don’t see your application? Get in touch with us.

Integration Options
How 4D.TWO Connects to Your Process

DirectMount
The sensor is mounted directly to the processing optics. A direct optical path between the process and the sensor enables efficient capture of process emissions with minimal optical complexity.

DirectMount with 90° Deflection Unit
The sensor is mounted offset from the optical axis. A 90° deflection unit redirects the optical path to the sensor, enabling integration where space constraints or mechanical conditions prevent direct inline mounting.

Fiber
The sensor is installed remotely from the process. Process emissions are captured by an optical assembly and transmitted to the sensor via an optical fiber, enabling flexible integration even when installation space near the process is limited.
Your Application Determines the Configuration.
Hardware and integration options can be combined to match the requirements of each application. This flexibility eliminates the need for a completely different sensor concept for every installation scenario or monitoring task.

From Signal Acquisition to Process Monitoring
Capture. Understand. Act.
01 | Capture
4D.TWO® captures multiple types of optical information from the laser process.
02 | Analyze
The available signals can be analyzed and evaluated for the specific application.
03 | Configure
Relevant signals and settings are selected for the respective monitoring task.
04 | Monitor
The resulting insights form the foundation of an application-specific process monitoring solution.

Your Benefits
Why 4D.TWO?
More Insight from a Single Sensor
Multiple optical signals are captured simultaneously, providing a richer data foundation for process analysis.
Adaptable to Your Application
Choose the hardware, integration method, and software configuration that best fit your application requirements.
Capture Short Process Events
Lossless Technology enables the detection of extremely short signal variations while reducing data volume.
From Single Applications to OEM Integration
Standard variants for conventional applications and OEM versions for advanced customer-specific integration.
One Platform for Different Laser Processes
Use 4D.TWO® across a wide range of laser applications, from welding and cutting to additive manufacturing.

In Detail
Technical Data
Full integral @100 kHz lossless*
@100 kHz lossless*
+
Spectrometer
4x @6 kHz lossless**
+
Spectrometer
16x @6 kHz lossless**
1x Connector for I/O (Analog In, Analog Out), mechanically keyed to prevent mismatching (45°)
1x Connector for the DIRECTMOUNT Focus Unit / SMA optical fiber
63 x 78 x 91.5 mm
DIRECTMOUNT:
67.3 x 78 x 150.7 mm
DIRECTMOUNT with 90 ° Deflection Unit:
67.3 x 85.8 x 213.5 mm
**6 kHz lossless ≙ 100 Kilohertz Class Defect Information
Full integral @100 kHz lossless*
@100 kHz lossless*
+
Spectrometer
4x @6 kHz lossless**
+
Spectrometer
16x @6 kHz lossless**
1x Connector for I/O (Analog In, Analog Out), mechanically keyed to prevent mismatching (45°)
1x Connector for the DIRECTMOUNT Focus Unit / SMA optical fiber
63 x 78 x 91.5 mm
DIRECTMOUNT:
67.3 x 78 x 150.7 mm
DIRECTMOUNT with 90 ° Deflection Unit:
67.3 x 85.8 x 213.5 mm
**6 kHz lossless ≙ 100 Kilohertz Class Defect Information
Patent
The respective patent with the title Device for the spectrally resolved detection of optical radiation (file number DE: 10 2021 111 892.1) can be found here.
Which 4D.TWO is right for your laser process?
The appropriate configuration depends on your laser process, the relevant process signals, and the available installation space. Together, we’ll find the right combination of hardware and integration options for your application.
Which 4D.TWO is right for your laser process?
The appropriate configuration depends on your laser process, the relevant process signals, and the available installation space. Together, we’ll find the right combination of hardware and integration options for your application.
